Legacy Semiconductor Test Systems

September 6, 2017

Jennifer Shuttleworth

The MTEK Subsystem (Marvin Test Expansion Kit) from Marvin Test Solutions (MTS), Inc. (Irvine, CA) adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices. Based on MTS’ portfolio of PXI/PXIe chassis and instrumentation as well as selections from other industry suppliers, the company says MTEK allows customers to configure a subsystem with exactly the resources needed to deliver the capabilities lacking in their current legacy ATE. The compact MTEK is an easy-to-integrate, open architecture plug-and-play solution that cost-effectively adds RF, high-performance digital, and/or high-performance analog capabilities. MTEK is compatible with multiple legacy semiconductor test platforms, including Teradyne, LTX/Credence, Eagle, ASL100, Sentry and Verigy. According to MTS, MTEK is easily expandable in the field and is designed to support both engineering and production environments.