Many engineers rely on external switch matrices to extend 2-port VNAs for multi-channel measurements — but this approach comes with tradeoffs in speed, accuracy, and system complexity. Understanding when these tradeoffs matter is critical as RF and high-speed digital systems continue to scale.
This 60-minute webinar provides a clear, practical comparison between switched 2-port and true multiport VNA measurement architectures. Attendees will learn how sweep count, insertion loss, isolation, and calibration complexity differ between approaches and how those differences affect real-world results. By examining representative use cases — including cable assemblies, beamforming arrays, and production test of multi-channel devices — the session will help engineers and test teams select the most appropriate strategy for their measurement goals.
Key topics include:
- Limitations of switched 2-port systems
- How true N-port measurements are performed
- Calibration strategies for large port counts
- Engineering and production test implications
An audience Q&A session will follow the technical presentation.
Speakers:
Brian Walker, Senior RF Engineer, Copper Mountain Technologies
Brian Walker is the Senior RF Engineer, SME, at Copper Mountain Technologies. He helps customers resolve technical issues and develops new solutions for VNA applications in test and measurement. Brian has 40 years of RF Design experience. He previously was the Manager of RF Design at Bird Electronics, where he directed a team of RF designers and created new and innovative products. Prior to that, he worked for the Motorola Component Products Group and was responsible for the design of ceramic comb-line filters for communications devices. Brian holds a degree from the University of New Mexico and is a senior member of the IEEE, who has authored three U.S. Patents.
Moderator:
Amanda Hosey, Editor, SAE Media Group
