Manual microscopy is giving way more and more to video-measuring machines for inspection of semiconductor components, and manufacturing advancements in 3D video measuring solutions for the electronics industry is essential. Semiconductor circuitry is becoming increasingly miniaturized and design tolerances ever tighter. There has never been a greater need for repeatable, reproducible measurements to be taken at high throughput rates with equipment of high magnification and resolution.
Automated video measuring machines address these needs, providing an ideal platform for inspecting mini and micro-LEDs, MEMS and sensors, and wafer- and panel- level semiconductor packaging. Measurement accuracy can be increased three-fold, while measurement speed can be up to six times faster. This 60-minute Webinar will provide insight into the ways automated video inspection technology can improve electronic component inspection.
- How this equipment can improve process reliability by increasing the number of measurement points and minimizing human error.
- A logical path towards Quality 4.0 by automating this metrology function and feeding back the data to a manufacturing line to correct production deviations and improve production yield.
An audience Q&A follows the technical presentation.
Brad Bartmess, Sales Director, Vision Group, Nikon Metrology Inc.
Brad Bartmess serves as Sales Director for the Vision Group at Nikon, where he has worked for more than 25 years. He previously held positions as Product Manager for measuring products, including the Nexiv line of video measuring tools, and the National Channel Manager, responsible for distribution of microscopes, measuring, and Nexiv video inspection systems.
Amanda Hosey, Editor, SAE Media Group